Noncontact method for calibration of lateral forces in scanning force microscopy

Kyle Wagner1, Peng Cheng, Dmitri Vezenov

  • 1Department of Chemistry, Lehigh University, Bethlehem, Pennsylvania 18015, USA.

Summary

This study introduces a noncontact method for calibrating lateral force microscopy. It uses cantilever thermal noise to accurately measure forces without damaging the microscope tip.