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Noncontact method for calibration of lateral forces in scanning force microscopy
Kyle Wagner1, Peng Cheng, Dmitri Vezenov
1Department of Chemistry, Lehigh University, Bethlehem, Pennsylvania 18015, USA.
Langmuir : the ACS Journal of Surfaces and Colloids
|March 17, 2011
Summary
This study introduces a noncontact method for calibrating lateral force microscopy. It uses cantilever thermal noise to accurately measure forces without damaging the microscope tip.
Area of Science:
- Atomic Force Microscopy
- Nanotechnology
- Surface Science
Background:
- Lateral force microscopy (LFM) requires accurate calibration for reliable measurements.
- Existing calibration methods can be time-consuming and may damage the cantilever tip.
- In situ calibration in various environments, including liquids, is challenging.
Purpose of the Study:
- To develop a noncontact calibration procedure for lateral force microscopy.
- To enable accurate calibration of both normal and lateral forces.
- To provide a method suitable for in situ calibration in air and liquids.
Main Methods:
- Utilizes the thermal noise spectrum of the cantilever.
- Employs Sader's method to determine the cantilever's spring constant from its thermal noise spectrum.
- Requires only the cantilever's plan view dimensions, measurable via optical microscopy.
- A two-step procedure for calibration in liquids involves capturing thermal spectra in air and the liquid.
Main Results:
- The noncontact calibration procedure accurately determines force sensitivity.
- Results from the thermal noise technique show good agreement with traditional wedge calibration.
- The method successfully calibrates normal and lateral forces without surface contact.
Conclusions:
- This noncontact calibration procedure offers a robust and non-destructive method for LFM.
- The technique is effective for in situ calibration in diverse environments, including viscous fluids.
- Eliminates the risk of tip damage or contamination during the calibration process.

