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Updated: Jun 3, 2026

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization
06:58

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization

Published on: July 12, 2016

Vanishing magnetic shear and electron transport barriers in the RFX-mod reversed field pinch

M Gobbin1, D Bonfiglio, D F Escande

  • 1Consorzio RFX, Associazione EURATOM-ENEA sulla Fusione Corso Stati Uniti, 4 35127 Padova-Italy.

Physical Review Letters
|March 17, 2011
PubMed

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