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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
Total Internal Reflection Fluorescence Microscopy01:05

Total Internal Reflection Fluorescence Microscopy

Total internal reflection fluorescence microscopy or TIRF is an advanced microscopic technique used to visualize fluorophores in samples close to a solid surface with a higher refractive index, such as a glass coverslip. TIRF only allows fluorophores in proximity to the solid surface to be excited. When light from a medium with a lower refractive index (such as air) hits the glass coverslip at a critical angle, the light undergoes total internal reflection stead of passing through the glass.
Raman Spectroscopy Instrumentation: Overview01:26

Raman Spectroscopy Instrumentation: Overview

A conventional Raman spectrophotometer includes a laser source, a sample holding system, a wavelength selector, and a detector.
The monochromatic laser source, typically using visible or near-infrared radiation, generates a highly focused beam of light. This light interacts with the molecules of the sample, scattering some of the light. Liquid and gaseous samples are usually tested in ordinary glass capillaries, while solids can be analyzed as powders packed in capillaries or as potassium...

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Related Experiment Video

Updated: Jun 3, 2026

Single-Molecule Surface-Enhanced Raman Scattering Measurements Enabled by Plasmonic DNA Origami Nanoantennas
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Tip-enhanced Raman mapping with top-illumination AFM.

K L Andrew Chan1, Sergei G Kazarian

  • 1Department of Chemical Engineering, Imperial College London, SW7 2AZ, UK.

Nanotechnology
|March 18, 2011
PubMed
Summary

Tip-enhanced Raman scattering (TERS) can now image non-transparent samples using an upright microscope. This advancement in TERS nano-imaging offers high spatial resolution for nanoscale materials.

Area of Science:

  • Nanotechnology
  • Chemical Imaging
  • Spectroscopy

Background:

  • Tip-enhanced Raman scattering (TERS) typically uses an inverted configuration, limiting analysis to transparent samples.
  • Existing reflection-mode TERS often requires system customization.

Purpose of the Study:

  • To demonstrate TERS nano-imaging in reflection mode using an upright microscope.
  • To enable chemical analysis of non-transparent nanoscale materials.

Main Methods:

  • Utilized an upright microscope with a gold-coated silicon atomic force microscope (AFM) cantilever.
  • Employed a standard integrated AFM/Raman system with minimal modifications.

Main Results:

  • Achieved TERS nano-images of a single-walled carbon nanotube.

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  • Obtained a spatial resolution of approximately 20-50 nm.
  • Conclusions:

    • Demonstrated the feasibility of TERS nano-imaging in reflection mode with an upright microscope.
    • Highlighted the potential for studying non-transparent nanoscale materials without extensive system modifications.