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Direct observation of surfactant aggregate behavior on a mica surface using high-speed atomic force microscopy

Shigeto Inoue1, Takayuki Uchihashi, Daisuke Yamamoto

  • 1Kao Corporation, Wakayama 640-8580, Japan. inoue.shigeto@kao.co.jp

Chemical Communications (Cambridge, England)
|March 29, 2011
PubMed

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Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...