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Updated: Jun 3, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on: December 5, 2015

Electronic structure and carrier mobility in graphdiyne sheet and nanoribbons: theoretical predictions

Mengqiu Long1, Ling Tang, Dong Wang

  • 1Key Laboratory of Organic OptoElectronics and Molecular Engineering, Department of Chemistry, Tsinghua University, Beijing 100084, P. R. China.

ACS Nano
|March 30, 2011
PubMed

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