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Published on: December 20, 2012
In situ transmission electron microscopy imaging of grain growth in a platinum nanobridge induced by electric current
B Gao1, M Rudneva, K S McGarrity
1Kavli Institute of Nanoscience, Delft University of Technology, Delft, The Netherlands. b.gao@fkf.mpg.de
Abstract:
We report an in situ transmission electron microscopy (TEM) imaging of grain growth in a Pt nanobridge induced by a high electric current density. The change in morphology at the nanoscale was recorded in real time together with the electrical characterization of the Pt nanobridge. We find a drop in the differential resistance as the voltage across the bridge is increased; TEM inspection shows that this coincides with thermally induced grain growth, indicating that a reduction of grain boundary scattering is the cause of the resistance decrease.

