Spectrophotometry: Introduction
Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation
UV–Vis Spectrometers
IR Spectrometers
Atomic Emission Spectroscopy: Instrumentation
Scanning Electron Microscopy
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Elemental-sensitive Detection of the Chemistry in Batteries through Soft X-ray Absorption Spectroscopy and Resonant Inelastic X-ray Scattering
Published on: April 17, 2018
Xinhui Duan1, Jia Wang, Lifeng Yu
1Department of Radiology, Mayo Clinic, 200 First Street Southwest, Rochester, Minnesota 55905, USA.
Accurately estimating X-ray spectra from CT scanners using transmission data and the expectation maximization (EM) method is crucial for dose calculations and material decomposition. This robust technique validates well against simulations and phantom experiments.
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