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Related Experiment Video

Updated: Jun 3, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

Compact very low temperature scanning tunneling microscope with mechanically driven horizontal linear positioning

H Suderow¹, I Guillamon, S Vieira

¹Laboratorio de Bajas Temperaturas, Departamento de Física de la Materia Condensada Instituto de Ciencia de Materiales Nicolás Cabrera, Facultad de Ciencias Universidad Autónoma de Madrid, 28049 Madrid, Spain. Hermann.suderow@uam.es

The Review of Scientific Instruments

|April 5, 2011

Summary

This study presents a new scanning tunneling microscope for ultra-low temperatures. It enables precise manipulation and imaging of nanoscale structures, even in strong magnetic fields.

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Last Updated: Jun 3, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

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Published on: January 19, 2018

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Area of Science:

Condensed Matter Physics
Surface Science
Nanotechnology

Background:

Scanning tunneling microscopy (STM) is crucial for nanoscale surface analysis.
Operating STM at ultra-low temperatures (0.1 K) presents significant challenges in sample positioning and stability.
Precise in situ manipulation of delicate samples is required for advanced materials research.

Purpose of the Study:

To develop and characterize a scanning tunneling microscope system for operation within a dilution refrigerator.
To enable macroscopic sample positioning with nanometer accuracy at cryogenic temperatures.
To demonstrate the capability for in situ sample cleaving and atomic resolution imaging at 0.1 K.

Main Methods:

Integration of a macroscopic sample stage with nanometer-level accuracy into a dilution refrigerator.
Development of a stable tip-sample positioning system that maintains accuracy during cooldown.
In situ cleaving mechanism for hard crystalline samples.
Atomic resolution STM measurements at 0.1 K and in 8 T magnetic fields.

Main Results:

The sample stage allows macroscopic movement (up to 1 cm) with tens of nanometers accuracy.
Tip positioning stability is within a few micrometers after cooldown from room temperature.
Successful in situ cleaving of a hard crystalline sample.
Atomic resolution imaging of NbSe(2) achieved at 0.1 K and 8 T without increased noise or heat dissipation.

Conclusions:

The developed STM system offers unprecedented capabilities for studying micrometer-sized samples and nanostructures at ultra-low temperatures.
The system's stability and in situ manipulation features are suitable for advanced cryogenic surface science.
The demonstrated atomic resolution in extreme conditions opens new avenues for condensed matter research.