Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Linkage to TB and HIV care for persons who smoke illicit drugs: a prospective cohort study.

IJTLD open·2026
Same author

Smoked drug use in patients with TB is associated with higher bacterial burden.

The international journal of tuberculosis and lung disease : the official journal of the International Union against Tuberculosis and Lung Disease·2023
Same author

[French clinical practice guidelines for the diagnosis and management of lung disease with alpha 1-antitrypsin deficiency].

Revue des maladies respiratoires·2022
Same author

Conductance switching at the nanoscale of diarylethene derivative self-assembled monolayers on La<sub>0.7</sub>Sr<sub>0.3</sub>MnO<sub>3</sub>.

Nanoscale·2020
Same author

Estimation of π-π Electronic Couplings from Current Measurements.

Nano letters·2017
Same author

Deformation Localization in Molecular Layers Constrained between Self-Assembled Au Nanoparticles.

Langmuir : the ACS journal of surfaces and colloids·2017

Related Experiment Video

Updated: Jun 3, 2026

Surface Potential Measurement of Bacteria Using Kelvin Probe Force Microscopy
10:49

Surface Potential Measurement of Bacteria Using Kelvin Probe Force Microscopy

Published on: November 28, 2014

Note: Quantitative (artifact-free) surface potential measurements using Kelvin force microscopy.

T Mélin1, S Barbet, H Diesinger

  • 1Institute of Electronics, Microelectronics and Nanotechnology, CNRS-UMR 8520, Avenue Poincaré, BP 60069, 59652 Villeneuve d'Ascq Cedex, France. thierry.melin@isen.iemn.univ-lille1.fr

The Review of Scientific Instruments
|April 5, 2011
PubMed
Summary
This summary is machine-generated.

Kelvin force microscopy (KFM) measurements can be prone to artifacts affecting surface potential accuracy. This study demonstrates a correction method, achieving artifact-free KFM measurements with high accuracy.

More Related Videos

Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys
12:18

Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys

Published on: June 27, 2022

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping
14:13

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

Published on: October 24, 2014

Related Experiment Videos

Last Updated: Jun 3, 2026

Surface Potential Measurement of Bacteria Using Kelvin Probe Force Microscopy
10:49

Surface Potential Measurement of Bacteria Using Kelvin Probe Force Microscopy

Published on: November 28, 2014

Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys
12:18

Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys

Published on: June 27, 2022

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping
14:13

Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping

Published on: October 24, 2014

Area of Science:

  • Surface science
  • Scanning probe microscopy
  • Metrology

Background:

  • Kelvin force microscopy (KFM) is a powerful technique for measuring local surface potentials.
  • KFM measurements can be susceptible to artifacts caused by external perturbations and internal instrument parameters.
  • These artifacts can lead to significant inaccuracies, typically around 1 V, in surface potential measurements.

Purpose of the Study:

  • To analyze and correct for artifacts in Kelvin force microscopy (KFM) measurements.
  • To improve the accuracy and reliability of quantitative surface potential measurements.
  • To demonstrate a robust KFM implementation in ambient air conditions.

Main Methods:

  • Investigated the influence of KFM internal parameters (cantilever excitation frequency, feedback-loop phase) on experimental results.
  • Developed and applied a correction strategy to mitigate identified artifacts.
  • Validated the corrected KFM method under ambient air conditions.

Main Results:

  • Identified strong dependences of KFM experimental results on internal instrument parameters, causing artifacts up to ~1 V.
  • Successfully implemented a correction method to eliminate these artifactual influences.
  • Achieved artifact-free Kelvin force microscopy (KFM) measurements with a high accuracy of approximately 30 mV.

Conclusions:

  • External perturbations and internal KFM parameters can introduce significant artifacts in surface potential measurements.
  • A demonstrated correction method enables artifact-free and quantitative KFM measurements.
  • The developed approach enhances the reliability of KFM for precise surface potential analysis in ambient environments.