Simple modeling of plasmon resonances in Ag/SiO2 nanocomposite monolayers

Normal incidence transmittance and reflectance spectra of sputtered nanocomposite monolayer films of Ag in SiO2, buried and unburied, showed significant redshifted plasmon resonances from 410 to 455 nm, which could be well interpreted with a simple model that starts from the Maxwell Garnett theory and the Kreibig extension of the Drude-Lorentz equation, but with a further extension related to the dipolar interaction between the metal particles distributed on a surface.