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Scattering And Absorption of Light in Planetary Regoliths

Scattering And Absorption of Light in Planetary Regoliths

Published on: July 1, 2019

Optical component interface scatter characterization by selective polarization extinction.

Gaëlle Georges¹, Carole Deumié, Claude Amra

¹Institut Fresnel, CNRS, Aix-Marseille Université, Ecole Centrale Marseille, Marseille, France. gaelle.georges@fresnel.fr

|April 5, 2011

Summary

This summary is machine-generated.

This study introduces null ellipsometry to selectively measure light scattering from individual layers in multilayer components. The technique effectively isolates scattering from specific interfaces, improving analysis of optical materials.

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Area of Science:

Optics and Photonics
Materials Science
Surface Science

Background:

Scattered light from multilayer components complicates interface analysis.
Existing techniques struggle to isolate scattering from individual layers.

Purpose of the Study:

To present a novel procedure for selective extinction of scattered light.
To enable scattering measurements from individual layers within multilayer systems.

Main Methods:

Utilizes "null ellipsometry" principles for selective light extinction.
Analyzes conditions to extinguish scattered light from unwanted interfaces.
Investigates sensitivity to experimental parameters and optical thickness.

Main Results:

Demonstrates selective scattering measurement from individual layers.
Successfully isolates scattered light from desired interfaces.
Experimental data aligns with white-light optical surface profilometry.

Conclusions:

Null ellipsometry provides a powerful tool for multilayer scattering analysis.
The technique is applicable to components with similar surface profiles and low bulk scattering.
Enables precise characterization of individual layer interfaces.