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Concurrent Quantitative Conductivity and Mechanical Properties Measurements of Organic Photovoltaic Materials using AFM
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Nanoscale characterization of tetrabenzoporphyrin and fullerene-based solar cells by photoconductive atomic force

Michele Guide1, Xuan-Dung Dang, Thuc-Quyen Nguyen

  • 1Mitsubishi Chemical Center for Advanced Materials, Department of Chemistry and Biochemistry, University of California-Santa Barbara, CA 93106, USA.

Advanced Materials (Deerfield Beach, Fla.)
|April 5, 2011
PubMed
Abstract

No abstract available in PubMed .

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Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...