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Atomic Force Microscopy

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Related Experiment Video

Updated: Jun 2, 2026

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

A large-sample atomic force microscope observing in both air and liquid.

Xia Fu¹, Dongxian Zhang, Haijun Zhang

¹State Key Laboratory of Modern Optical Instrumentation, Zhejiang University, Hangzhou 310027, People's Republic of China.

Microscopy Research and Technique

|April 13, 2011

Summary

This summary is machine-generated.

A new atomic force microscope (AFM) enables high-resolution imaging of large samples in both air and liquid. This advanced AFM system offers wide-range, high-resolution imaging capabilities for diverse materials and environments.

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Atomic Force Microscopy Cantilever-Based Nanoindentation: Mechanical Property Measurements at the Nanoscale in Air and Fluid

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Published on: December 2, 2022

Area of Science:

Materials Science
Nanotechnology
Surface Science

Background:

Atomic Force Microscopy (AFM) is crucial for nanoscale surface characterization.
Existing AFM systems often face limitations in sample size and environmental versatility.
There is a need for AFM systems capable of high-resolution imaging of large samples in various conditions.

Purpose of the Study:

To develop and demonstrate a large-sample atomic force microscope (AFM) with high resolution in both air and liquid.
To showcase the system's ability to perform wide-scan-range imaging with minimal distortion.
To validate the AFM's performance through experiments on diverse sample types and environments.

Main Methods:

Development of a unique beam tracking method for stable cantilever reflection during scanning.
Integration of a stand-alone AFM probe unit with an automated large sample stage.
Implementation of an image stitching method for creating large-area merged images.
Utilization of a large-volume liquid bath for in-liquid sample observation.

Main Results:

Achieved high-resolution, wide-range imaging of large samples up to millimeter scales with nanometer resolution.
Demonstrated stable and high-quality topographic imaging of gold patterns on glass.
Successfully characterized the porosity of filter paper in both air and water.
Obtained large-area AFM images of anodic aluminum oxide templates by merging multiple scans.

Conclusions:

The developed large-sample AFM system provides high resolution and wide range imaging capabilities.
The system exhibits remarkable versatility, functioning effectively in both air and liquid environments.
This AFM technology offers significant advancements for the analysis of large samples across various scientific and industrial applications.