Sensitive and robust second-harmonic interferometer for measuring the dispersion of the electro-optic coefficients in...

Area of Science:

• Nonlinear Optics
• Materials Science
• Optical Engineering

Background:

• Electro-optic (EO) coefficients are crucial material properties for optical modulation.
• Accurate measurement of EO coefficients, especially their wavelength dispersion, is essential for device design.
• Existing methods may lack stability or the ability to probe wavelength dependence.

Purpose of the Study:

• To introduce and validate Second-Harmonic Interferometry (SHI) for measuring EO coefficients.
• To combine interferometric precision with single-beam stability.
• To simultaneously measure wavelength dispersion of EO coefficients.

Main Methods:

• Development of a Second-Harmonic Interferometry (SHI) setup.
• Simultaneous measurement of EO coefficients r(33)(T) and r(13)(T).
• Utilizing lithium niobate as a test material at 1064 nm and 532 nm.

Main Results:

• Demonstrated the effectiveness of SHI for measuring EO coefficients.
• Successfully obtained simultaneous measurements of r(33)(T) and r(13)(T).
• Provided measurements at both fundamental (1064 nm) and second-harmonic (532 nm) wavelengths.

Conclusions:

• SHI is a viable technique for characterizing EO materials.
• The method allows for simultaneous measurement of multiple EO coefficients and their wavelength dispersion.
• This technique enhances the characterization of electro-optic crystals like lithium niobate.