Related Experiment Video
Updated: Jun 2, 2026
Atomically Defined Templates for Epitaxial Growth of Complex Oxide Thin Films
Published on: December 4, 2014
Nanoscale bit formation in highly (111)-oriented ferroelectric thin films deposited on glass substrates for
Dae Hong Kim1, Yong Kwan Kim, Seungbum Hong
1Department of Materials Science and Engineering, Pohang University of Science and Technology (POSTECH), Pohang, Korea.
Abstract:
PbTiO(3) (PTO) ferroelectric films on Pt(111) bottom electrode layers covering Ta/glass were prepared using pulsed laser deposition. X-ray diffraction patterns revealed that the PTO films were preferentially (111)-oriented. The films were highly crystalline and had a smooth surface with root mean square (RMS) roughness of 1.5 nm. Ferroelectric properties of the PTO films were characterized using piezoresponse force microscopy (PFM). PFM techniques achieved ferroelectric polarization bits with a minimum width of 22 nm, which corresponds to a potential recording density of 1.3 Tbit/in(2) in ferroelectric storage devices.
More Related Videos
08:07Ultrahigh Density Array of Vertically Aligned Small-molecular Organic Nanowires on Arbitrary Substrates
Published on: June 18, 2013
06:27Fabrication of Magnetic Nanostructures on Silicon Nitride Membranes for Magnetic Vortex Studies Using Transmission Microscopy Techniques
Published on: July 2, 2018