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Updated: Jun 2, 2026

Improving High Viscosity Extrusion of Microcrystals for Time-resolved Serial Femtosecond Crystallography at X-ray Lasers
Published on: February 28, 2019
New developments in fabrication of high-energy-resolution analyzers for inelastic X-ray spectroscopy
Ayman H Said1, Harald Sinn, Ralu Divan
1Advanced Photon Source, Argonne National Laboratory, Argonne, IL, USA. said@aps.anl.gov
Abstract:
In this work new improvements related to the fabrication of spherical bent analyzers for 1 meV energy-resolution inelastic X-ray scattering spectroscopy are presented. The new method includes the use of a two-dimensional bender to achieve the required radius of curvature for X-ray analyzers. The advantage of this method is the ability to monitor the focus during bending, which leads to higher-efficiency analyzers.
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