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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
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Atomic Fluorescence Spectroscopy01:29

Atomic Fluorescence Spectroscopy

Atomic fluorescence spectroscopy (AFS) is an analytical technique that involves the electronic transitions of atoms in a flame, furnace, or plasma being excited by electromagnetic (EM) radiation. When these atoms absorb energy, they become excited and subsequently release energy as they return to their original state. This emitted light, or "fluorescence," is observed at a right angle to the incident beam. Both absorption and emission processes transpire at distinct wavelengths, which are...

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Related Experiment Video

Updated: Jun 2, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
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A high frequency sensor for optical beam deflection atomic force microscopy.

Raoul Enning1, Dominik Ziegler, Adrian Nievergelt

  • 1Nanotechnology Group, Department of Mechanical and Process Engineering, ETH Zurich, 8092 Zurich, Switzerland. enning@alumni.ethz.ch

The Review of Scientific Instruments
|May 3, 2011
PubMed
Summary
This summary is machine-generated.

This study introduces a new electronic readout for optical beam deflection systems. It processes signals as currents, simplifying design and improving bandwidth for high-sensitivity measurements.

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Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

Area of Science:

  • Physics
  • Electronics Engineering
  • Materials Science

Background:

  • Optical beam deflection is crucial for high-resolution imaging.
  • Existing electronic readouts often involve complex voltage conversions, limiting performance.
  • Quadrant photodiodes are key components in these deflection systems.

Purpose of the Study:

  • To develop a novel electronic readout for quadrant photodiode based optical beam deflection.
  • To improve design simplicity, reduce parasitic effects, and enhance bandwidth.
  • To demonstrate high sensitivity and low noise performance for atomic resolution imaging.

Main Methods:

  • Utilized a current-based signal processing approach, avoiding immediate voltage conversion.
  • Employed bipolar current mirrors for transistor-level mathematical operations, including signal normalization.
  • Integrated commercially available components for the readout system.

Main Results:

  • Achieved a 3 dB bandwidth of 20 MHz with 1-4 mW laser power.
  • Demonstrated deflection sensitivities up to 0.5-1 V/nm.
  • Recorded deflection noise levels below 4.5 fm/Hz.
  • Successfully performed atomic resolution imaging of muscovite mica in water using FM-AFM.

Conclusions:

  • The novel current-based readout offers significant advantages in simplicity and performance.
  • Bandwidth is primarily limited by photodiode junction capacitance, influenced by laser power.
  • The system's sensitivity and low noise enable advanced applications like atomic resolution AFM.