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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Related Experiment Video

Updated: Jun 2, 2026

High-Speed Magnetic Tweezers for Nanomechanical Measurements on Force-Sensitive Elements

High-Speed Magnetic Tweezers for Nanomechanical Measurements on Force-Sensitive Elements

Published on: May 12, 2023

High speed nano-metrology.

Andrew D L Humphris¹, Bin Zhao, David Catto

¹Infinitesima Ltd, Oxford Centre for Innovation, Mill St., Oxford OX2 0JX, United Kingdom.

The Review of Scientific Instruments

|May 3, 2011

Summary

This summary is machine-generated.

This study introduces a novel atomic force microscopy (AFM) method for faster, more accurate nanoscale measurements. The new approach achieves high-resolution surface imaging at unprecedented speeds, enabling real-time quality control in manufacturing.

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Published on: June 13, 2023

Area of Science:

Nanotechnology
Metrology
Surface Science

Background:

Atomic Force Microscopy (AFM) is crucial for nanoscale manufacturing but limited by slow scan speeds.
Increased scan speed in conventional AFM degrades measurement resolution and repeatability.
A need exists for rapid and accurate measurement techniques for functional devices at the nanometre scale.

Purpose of the Study:

To develop a new AFM approach for direct, feedback-independent surface height measurement.
To overcome the speed limitations imposed by the z-feedback loop in conventional AFM.
To enable high-speed, high-resolution imaging for in-line manufacturing applications.

Main Methods:

A laser interferometer is focused onto the back of the AFM tip for direct height measurement.
A passive, feedback-free method maintains tip-sample contact, decoupling height measurement from feedback control.
Conventional laser reflection detection is repurposed for minimizing tip-sample forces, not topography generation.

Main Results:

The new AFM system achieves true height imaging with direct, feedback-independent measurements.
Scan speed constraints from the z-feedback loop are eliminated.
High-resolution images (up to 36 × 36 μm²) are obtained at a rate of 1 image/second.

Conclusions:

This novel AFM method significantly enhances measurement speed and accuracy for nanoscale manufacturing.
The system's speed and resolution are suitable for real-time, in-line quality control applications.
Direct height measurement and feedback-free contact control enable unprecedented imaging rates.