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Related Concept Videos

Gas Chromatography: Types of Detectors-II01:19

Gas Chromatography: Types of Detectors-II

In gas chromatography, different detectors are employed to meet specific analytical needs. These detectors are often categorized based on their detection mechanisms and the types of compounds they are best suited to analyze. Thermal Conductivity Detectors (TCD), Flame Ionization Detectors (FID), and Electron Capture Detectors (ECD) represent common categories, each with unique operating principles and applications. However, beyond these, several other detectors are designed for more specialized...
Inductively Coupled Plasma–Mass Spectrometry (ICP–MS): Overview01:19

Inductively Coupled Plasma–Mass Spectrometry (ICP–MS): Overview

In inductively coupled plasma–mass spectrometry (ICP–MS), an inductively coupled plasma (ICP) torch is used as an atomizer and ionizer. Solid samples are dissolved and volatilized before being introduced into the high-temperature argon plasma, while solution samples are nebulized and passed through the high-temperature argon plasma. Plasma dissociates the analytes and ionizes their component atoms to form a mixture of positive ions and molecular species. The positive ions are then passed on to...
Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation01:26

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy  (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used.
Tandem Mass Spectrometry01:21

Tandem Mass Spectrometry

Tandem mass spectrometry is a technique that uses multiple mass analyzers in series to obtain a higher selectivity and reduce chemical noise during analyte detection. Instruments with multiple analyzers separated by an interaction cell enable secondary fragmentation and selected study of the fragment ions.Secondary fragmentations occur in the interaction cell and can be induced by various factors. Fragmentation induced by collision with inert gases, such as N2, Ar, He, etc., is called...
Inductively Coupled Plasma-Mass Spectrometry (ICP-MS): Interferences01:20

Inductively Coupled Plasma-Mass Spectrometry (ICP-MS): Interferences

Inductively coupled plasma–mass spectrometry (ICP–MS) is a highly selective and sensitive technique for accurate elemental analysis. Though the analysis of ICP–MS mass spectra is comparatively straightforward, it is affected by spectroscopic and non-spectroscopic interferences. Spectroscopic interferences arise when the plasma contains ionic species with an m/z value the same as the analyte ion. Spectroscopic interference can be categorized as isobaric, polyatomic ions, and refractory oxide ion...
Phase Contrast and Differential Interference Contrast Microscopy01:26

Phase Contrast and Differential Interference Contrast Microscopy

Phase-Contrast Microscopes
In-phase-contrast microscopes, interference between light directly passing through a cell and light refracted by cellular components is used to create high-contrast, high-resolution images without staining. It is the oldest and simplest type of microscope that creates an image by altering the wavelengths of light rays passing through the specimen. Altered wavelength paths are created using an annular stop in the condenser. The annular stop produces a hollow cone of...

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Related Experiment Video

Updated: Jun 2, 2026

A Practical Guide on Coupling a Scanning Mobility Sizer and Inductively Coupled Plasma Mass Spectrometer (SMPS-ICPMS)
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A Practical Guide on Coupling a Scanning Mobility Sizer and Inductively Coupled Plasma Mass Spectrometer (SMPS-ICPMS)

Published on: July 11, 2017

Differential Individual Particle Analysis (DIPA): applications in particulate matter characterization.

Andrew Hunt1, David L Johnson

  • 1Earth and environmental Sciences Department, University of Texas at Arlington, Arlington, TX 76019, USA. hunt@uta.edu

Journal of Environmental Quality
|May 7, 2011
PubMed
Summary

Differential individual particle analysis (DIPA) characterizes environmental particulate matter by analyzing individual particles before and after chemical reactions. This method reveals how particle components associate and change under varying conditions.

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Last Updated: Jun 2, 2026

A Practical Guide on Coupling a Scanning Mobility Sizer and Inductively Coupled Plasma Mass Spectrometer (SMPS-ICPMS)
11:18

A Practical Guide on Coupling a Scanning Mobility Sizer and Inductively Coupled Plasma Mass Spectrometer (SMPS-ICPMS)

Published on: July 11, 2017

Measuring Sub-23 Nanometer Real Driving Particle Number Emissions Using the Portable DownToTen Sampling System
08:59

Measuring Sub-23 Nanometer Real Driving Particle Number Emissions Using the Portable DownToTen Sampling System

Published on: May 22, 2020

Area of Science:

  • Environmental Science
  • Analytical Chemistry
  • Materials Science

Background:

  • Scanning electron microscopy (SEM) and computer-controlled scanning electron microscopy (CCSEM) are vital for characterizing environmental particulate matter.
  • Understanding the chemical associations within individual particles is crucial for environmental studies.
  • Existing methods may not fully capture dynamic chemical changes at the particle level.

Purpose of the Study:

  • To introduce and illustrate the applications of differential individual particle analysis (DIPA) for environmental particulate matter.
  • To demonstrate DIPA's capability in determining component associations within individual particles.
  • To highlight DIPA's potential in describing particle behavior under changing chemical conditions.

Main Methods:

  • Utilizing SEM coupled with chemical extraction for individual particle analysis.
  • Implementing in situ DIPA to analyze the same particles before and after modification.
  • Employing ex situ DIPA with CCSEM for bulk sample modification and analysis pre- and post-reaction.

Main Results:

  • DIPA allows for the analysis of individual particles before and after chemical modification in a fluid environment.
  • In situ DIPA enables repeated analysis of the same particles under various conditions, providing time-dependent reaction insights.
  • CCSEM efficiently analyzes large numbers of particles, enhanced by rapid X-ray detection, for both in situ and ex situ DIPA.

Conclusions:

  • DIPA is a powerful technique for understanding the chemical associations and behavior of environmental particles.
  • Both in situ and ex situ DIPA, particularly with CCSEM, offer efficient and detailed characterization of particulate matter.
  • This approach provides valuable data on how environmental particles react and change in response to chemical stimuli.