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A Silicon-tipped Fiber-optic Sensing Platform with High Resolution and Fast Response
Published on: January 7, 2019
Surface-plasmon-resonance-based fiber-optic refractive index sensor: sensitivity enhancement.
1Department of Physics, Indian Institute of Technology Delhi, New Delhi, India.
Applied Optics
|May 11, 2011
Summary
This study enhances fiber-optic refractive index sensors using a silicon layer, improving sensitivity and durability. The silicon layer increases the electric field, boosting sensor performance for refractive index sensing.
Area of Science:
- Photonics and Optics
- Materials Science
- Sensor Technology
Background:
- Surface Plasmon Resonance (SPR) sensors are crucial for refractive index sensing.
- Enhancing SPR sensor sensitivity and stability is an ongoing research challenge.
- Dielectric layers can modify SPR characteristics.
Purpose of the Study:
- To investigate the effect of a high-index dielectric layer (silicon) on SPR-based fiber-optic refractive index sensors.
- To optimize sensor sensitivity and durability through dielectric layer integration.
- To analyze the influence of silicon layer thickness on sensor performance.
Main Methods:
- Experimental study of SPR-based fiber-optic sensors.
- Utilizing wavelength interrogation method for analysis.
- Incorporating silver and gold as SPR active metals with a silicon dielectric layer.
Main Results:
- A redshift in resonance wavelength was observed with increasing refractive index.
- Sensor sensitivity increased with silicon layer thickness, up to approximately 10 nm.
- Increased electric field intensity at the silicon-sensing interface correlated with higher sensitivity.
Conclusions:
- The integration of a silicon dielectric layer significantly enhances the sensitivity of SPR-based fiber-optic refractive index sensors.
- Silicon layers offer tunable resonance wavelengths and improved metal layer protection, increasing sensor durability.
- Experimental findings align with theoretical models, validating the approach for advanced sensor design.

