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A Fabrication and Measurement Method for a Flexible Ferroelectric Element Based on Van Der Waals Heteroepitaxy
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Device performance of ferroelectric/correlated oxide heterostructures for non-volatile memory applications

J Hoffman1, X Hong, C H Ahn

  • 1Department of Applied Physics and CRISP, Yale University, New Haven, CT 06511, USA. jason.hoffman@yale.edu

Nanotechnology
|May 17, 2011
PubMed

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