Chalcogenide phase-change memory nanotubes for lower writing current operation
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Updated: Jun 2, 2026

Writing and Low-Temperature Characterization of Oxide Nanostructures
Published on: July 18, 2014
Yeonwoong Jung1, Rahul Agarwal, Chung-Ying Yang
1Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia, PA 19104, USA.
Abstract:
We report the synthesis and characterization of Sb-doped Te-rich nanotubes, and study their memory switching properties under the application of electrical pulses. Te-rich nanotubes display significantly low writing currents due to their small cross-sectional areas, which is desirable for power-efficient memory operation. The nanotube devices show limited resistance ratio and cyclic switching capability owing to the intrinsic properties of Te. The observed memory switching properties of this new class of nanostructured memory elements are discussed in terms of fundamental materials properties and extrinsic geometrical effects.

