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Updated: Jun 2, 2026

In Situ Transmission Electron Microscopy with Biasing and Fabrication of Asymmetric Crossbars Based on Mixed-Phased a-VOx
Published on: May 13, 2020
Andrea Redaelli1, Agostino Pirovano
1R&D Technology Development, Numonyx, Agrate Brianza (MB), Italy. andrea.redaelli@numonyx.com
Phase change memory (PCM) reliability is confirmed at scaled dimensions. Nanoscale nucleation dynamics significantly impact PCM device retention and performance.
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Published on: March 9, 2019
04:09Demonstrating the Simplicity and In Situ Temperature Monitoring of the Mechanochemical Synthesis of Metal Chalcogenides Suitable for Thermoelectrics
Published on: August 30, 2024
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