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Fabrication and characterization of MIM diodes based on Nb/Nb2O5 via a rapid screening technique

Prakash Periasamy1, Joseph J Berry, Arrelaine A Dameron

  • 1Department of Metallurgical and Materials Engineering, Colorado School of Mines, Golden, 80401, USA.

Advanced Materials (Deerfield Beach, Fla.)
|May 25, 2011
PubMed
Abstract

No abstract available in PubMed .

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