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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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Overview of Microscopy Techniques

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The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...

Atomic Absorption Spectroscopy: Atomization Methods

Atomic Absorption Spectroscopy: Atomization Methods

Atomic Absorption Spectroscopy (AAS) atomizes samples through flame atomization or electrothermal atomization. Flame atomization typically involves a nebulizer and spray chamber assembly to combine the sample with a fuel–oxidant mixture, creating a fine aerosol mist that enters a burner. Typically, the fuel and oxidant are combined in an approximately stoichiometric ratio. However, for atoms that are easily oxidized, a fuel-rich mixture may be more advantageous. Only about 5% of the aerosol...

Scanning Electron Microscopy

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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Cryo-electron Microscopy

Cryo-electron Microscopy

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Related Experiment Video

Updated: Jun 1, 2026

Scanning-probe Single-electron Capacitance Spectroscopy

Scanning-probe Single-electron Capacitance Spectroscopy

Published on: July 30, 2013

Cold-atom scanning probe microscopy.

M Gierling¹, P Schneeweiss, G Visanescu

¹CQ Center for Collective Quantum Phenomena and their Applications, Eberhard-Karls-Universität Tübingen, Auf der Morgenstelle 14, D-72076 Tübingen, Germany.

Nature Nanotechnology

|May 31, 2011

Summary

This summary is machine-generated.

Researchers developed a novel cold-atom scanning probe microscope using ultracold gases as the tip. This technique enables non-destructive nanoscale imaging and characterization of materials like carbon nanotubes.

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Area of Science:

Nanoscience and atomic force microscopy
Quantum gas microscopy
Surface science and nanotechnology

Background:

Scanning probe microscopy (SPM) is crucial for atomic-resolution surface studies in nanoscience.
Ultracold atomic gases in electromagnetic potentials are used to probe atom-surface electromagnetic interactions in chip-based systems.

Purpose of the Study:

To introduce a novel scanning probe microscope that integrates ultracold atomic gases as the microscope tip.
To leverage the unique properties of cold atoms for enhanced surface characterization.

Main Methods:

Development of a cold-atom scanning probe microscope utilizing ultracold atomic gases as the probe tip.
Application of the microscope to non-destructively measure carbon nanotube structures and individual free-standing nanotubes.
Utilizing Bose-Einstein condensation of the atomic gas to enhance the microscope's resolution.

Main Results:

Demonstration of a cold-atom scanning probe microscope with a large scanning volume, ultrasoft tip, and high purity.
The microscope exhibits sensitivity to electromagnetic forces, including dispersion forces near nanostructured surfaces.
Successful non-destructive measurement of carbon nanotube position and height was achieved.

Conclusions:

The cold-atom scanning probe microscope represents a significant advancement in nanoscale imaging.
Bose-Einstein condensation further improves the resolution, opening new possibilities for high-precision measurements.
This technique offers a versatile platform for studying electromagnetic interactions and characterizing nanostructures.