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Updated: Jun 1, 2026

Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes
Published on: May 23, 2017
Application of "parallel" moiré deflectometry and the single beam Z-scan technique in the measurement of the
Saifollah Rasouli1, H Ghasemi, M T Tavassoly
1Department of Physics, Institute for Advanced Studies in Basic Sciences (IASBS), Zanjan, Iran. rasouli@iasbs.ac.ir
Abstract:
In this paper, the application of "parallel" moiré deflectometry in measuring the nonlinear refractive index of materials is reported. In "parallel" moiré deflectometry the grating vectors are parallel, and the resulting moiré fringes are also parallel to the grating lines. Compared to "rotational" moiré deflectometry and the Z-scan technique, which cannot easily determine the moiré fringe's angle of rotation and is sensitive to power fluctuations, respectively, "parallel" moiré deflectometry is more reliable, which allows one to measure the radius of curvature of the light beam by measuring the moiré fringe spacing. The nonlinear refractive index of the sample, including the sense of the change, is obtained from the moiré fringe spacing curve. The method is applied for measuring the nonlinear refractive index of ferrofluids.

