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Related Concept Videos

Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Overview of Electron Microscopy01:25

Overview of Electron Microscopy

The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
Preparation of Samples for Electron Microscopy01:20

Preparation of Samples for Electron Microscopy

To be visualized by an electron microscope, either transmission or scanning, biological samples need to be fixed (stabilized) so the electron beam does not destroy them and dried thoroughly (desiccated/dehydrated) so the vacuum does not affect them. Fixation needs to be done as quickly as possible because the sample properties will start changing as soon as it is removed from its natural environment. For example, in a tissue sample, the oxygen levels begin decreasing, causing an altered...

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Related Experiment Video

Updated: Jun 1, 2026

Scanning-probe Single-electron Capacitance Spectroscopy
10:53

Scanning-probe Single-electron Capacitance Spectroscopy

Published on: July 30, 2013

Electrical modes in scanning probe microscopy.

Rüdiger Berger1, Hans-Jürgen Butt, Maria B Retschke

  • 1Max Planck Institute for Polymer Research, 55128 Mainz, Germany. berger@mpip-mainz.mpg.de.

Macromolecular Rapid Communications
|June 4, 2011
PubMed
Summary
This summary is machine-generated.

Scanning probe microscopy (SPM) offers advanced electrical characterization of nanoscale films. New SPM modes enable detailed analysis of soft matter electronics, crucial for molecular electronics advancements.

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Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope (AFM-SECM)
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Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope (AFM-SECM)

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Last Updated: Jun 1, 2026

Scanning-probe Single-electron Capacitance Spectroscopy
10:53

Scanning-probe Single-electron Capacitance Spectroscopy

Published on: July 30, 2013

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
11:33

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

Published on: January 19, 2018

Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope (AFM-SECM)
08:31

Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope (AFM-SECM)

Published on: February 10, 2021

Area of Science:

  • Nanotechnology
  • Materials Science
  • Electrical Engineering

Background:

  • Scanning probe microscopy (SPM) enables nanoscale surface property investigation, down to single molecules.
  • Characterizing electrical properties is increasingly vital for advancing molecular electronics.
  • Thin films and structured elements in research and industry reach nanometer scales.

Purpose of the Study:

  • To review major SPM modes for electrical characterization of thin films.
  • To demonstrate capabilities using focused ion beam-fabricated reference samples.
  • To present novel upcoming SPM modes for electrical analysis.

Main Methods:

  • Review of scanning conductive force microscopy, Kelvin probe force microscopy, and scanning electric field microscopy.
  • Fabrication of reference samples using focused ion beam deposition.
  • Analysis of samples using established and novel SPM electrical modes.

Main Results:

  • Established SPM modes effectively characterize electrical properties of nanostructured thin films.
  • Novel SPM modes show promise for advanced local current and microwave-based measurements.
  • Demonstrated applicability for functional layers in soft matter electronics.

Conclusions:

  • SPM electrical modes are essential tools for nanoscale electrical property characterization.
  • Emerging SPM techniques expand the possibilities for analyzing complex electronic materials.
  • These methods are suitable for studying soft matter electronic devices under realistic conditions.