Deconvolution
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Joule-Thomson Effect
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Updated: Jun 1, 2026

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
R Scannell1, M Beurskens, P G Carolan
1EURATOM/CCFE Fusion Association, Culham Science Centre, Abingdon, Oxfordshire, OX14 3DB, United Kingdom. rory.scannell@ccfe.ac.uk
Deconvoluting Thomson scattering (TS) profiles is crucial for accurate electron temperature and density measurements. A new, simplified method requires only the instrument function and observed profiles, making it accessible for various TS systems.
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