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Updated: Jun 1, 2026

Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
Ferromagnetic resonance of a single magnetic nanowire measured with an on-chip microwave interferometer
Hanqiao Zhang1, Ralu Divan, Pingshan Wang
1Intel Corporation, Columbia Design Center, South Carolina 29229, USA.
Abstract:
An on-chip microwave interferometer suitable for high-sensitivity nanoscale magnetic material characterization is proposed. The device cancels the background parasitic common mode noise automatically. The magnetization dynamics of a 240 nm wide, 5 μm long, and 70 nm thick single permalloy nanowire is investigated. Compared with a prototype device proposed previously, the proposed device has a more than 20 dB sensitivity improvement. Full wave three-dimensional simulation shows that the device has the capability of studying the fundamental physics of nanoscale magnetic devices.
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