Atomic Force Microscopy
Overview of Microscopy Techniques
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Jun 1, 2026

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
Published on: June 13, 2023
Yudong Zhang1, Yongchun Fang, Jie Yu
1Institute of Robotics and Automatic Information System, Nankai University, 300071 Tianjin, China.
This study introduces a variable-speed scanning (VSS) method for atomic force microscopy (AFM). The VSS method enhances imaging speed and maintains high image quality by dynamically adjusting scan rates.
14:13Atomic Force Microscopy of Red-Light Photoreceptors Using PeakForce Quantitative Nanomechanical Property Mapping
Published on: October 24, 2014
08:59High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping
Published on: March 22, 2024
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: