Overview of Microscopy Techniques
Scanning Electron Microscopy
Preparation of Samples for Electron Microscopy
Overview of Electron Microscopy
Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
Updated: Jun 1, 2026

Atom Probe Tomography Analysis of Exsolved Mineral Phases
Published on: October 25, 2019
K Tsuji1, K Wagatsuma, R Nullens
1Micro- and Trace Analysis Center, Department of Chemistry, University of Antwerp (UIA), B-2610 Antwerpen, Belgium, and Institute for Materials Research, Tohoku University, Katahira-2-1-1, Aoba, Sendai, 980-8577 Japan.
We developed grazing exit electron probe microanalysis (GE-EPMA) for surface analysis. This new method enhances detection of surface elements on samples like Si wafers and Mg-salt particles.
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: