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Related Concept Videos

Overview of Microscopy Techniques01:22

Overview of Microscopy Techniques

The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Related Experiment Video

Updated: Jun 1, 2026

Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope (AFM-SECM)
08:31

Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope (AFM-SECM)

Published on: February 10, 2021

Peer reviewed: scanning probe microscopy of environmental interfaces.

C M Eggleston, S R Higgins, P A Maurice

    Environmental Science & Technology
    |June 14, 2011
    PubMed
    Summary

    This study introduces a new method for generating atomic-scale views. These detailed views provide crucial data to enhance scientific models and improve their accuracy.

    Area of Science:

    • Materials Science
    • Computational Chemistry

    Background:

    • Accurate atomic-scale models are essential for understanding material properties.
    • Current modeling techniques often lack sufficient experimental validation.

    Purpose of the Study:

    • To develop a novel method for obtaining high-resolution atomic-scale data.
    • To provide experimental data for strengthening existing scientific models.

    Main Methods:

    • The study details a new experimental technique.
    • This technique captures atomic-scale structural information.

    Main Results:

    • The method successfully produced atomic-scale views.
    • The generated data offers unprecedented detail for model validation.

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    Probing the Structure and Dynamics of Interfacial Water with Scanning Tunneling Microscopy and Spectroscopy
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    Probing the Structure and Dynamics of Interfacial Water with Scanning Tunneling Microscopy and Spectroscopy

    Published on: May 27, 2018

    In Situ Characterization of Boehmite Particles in Water Using Liquid SEM
    11:59

    In Situ Characterization of Boehmite Particles in Water Using Liquid SEM

    Published on: September 27, 2017

    Related Experiment Videos

    Last Updated: Jun 1, 2026

    Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope (AFM-SECM)
    08:31

    Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope (AFM-SECM)

    Published on: February 10, 2021

    Probing the Structure and Dynamics of Interfacial Water with Scanning Tunneling Microscopy and Spectroscopy
    10:28

    Probing the Structure and Dynamics of Interfacial Water with Scanning Tunneling Microscopy and Spectroscopy

    Published on: May 27, 2018

    In Situ Characterization of Boehmite Particles in Water Using Liquid SEM
    11:59

    In Situ Characterization of Boehmite Particles in Water Using Liquid SEM

    Published on: September 27, 2017

    Conclusions:

    • The new method provides critical data for improving scientific models.
    • This advancement will lead to more accurate predictions in materials science.