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Updated: Jun 1, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Published on: May 10, 2021
A new approach to structure amplitude determination from 3-beam convergent beam electron diffraction patterns
Philip N H Nakashima1, Alexander F Moodie, Joanne Etheridge
1ARC Centre of Excellence for Design in Light Metals, Monash University, Victoria 3800, Australia. Philip.Nakashima@monash.edu
Abstract:
The intensity distribution in three-beam CBED patterns from centrosymmetric crystals can be inverted analytically to enable the direct measurement of crystal structure amplitudes and three-phase invariants. The accuracy of the measurements depends upon the accuracy and precision with which specific loci within the discs can be identified. The present work exploits the equivalence in form of the intensity distribution along these loci to provide an algorithm for their automated location, enabling the rapid and unequivocal identification of their position. Moreover, it demonstrates how the loci can be used to determine directly the relative magnitudes of structure amplitudes with superior accuracy and without recourse to complex pattern-matching calculations.
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