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Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
Published on: July 5, 2016
Karim Ali1, François Fleuret, David Hasler
1EPFL IC CVLAB, Station 14, Lausanne CH-1015, Switzerland. karim.ali@epfl.ch
This study introduces a novel object detection learning strategy that uses a single, adaptable classifier. This method reduces false alarms significantly without requiring pose-specific training data.
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