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Updated: May 31, 2026

Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
Published on: January 26, 2016
Experimental observation of glassy dynamics driven by gas adsorption on porous silicon
1Electromagnetic Division, INRIM, Strada delle Cacce 91, I-10135 Torino, Italy.
Abstract:
We report on electrical resistance measurements of mesoporous silicon samples at room temperature, in the presence of various dosages of ammonia, showing very slow non-exponential responses of the system to any variation of ammonia pressure. Resistance always relaxes according to a stretched exponential law, independently of the sign of the variation. Moreover, the system remembers its own history, and memory effects can be accounted for in a very simple way in the framework of the same relaxation law. A possible extrinsic scenario based on rearrangement of trapped charges is proposed and discussed. These findings suggest that mesoporous silicon in the presence of polar molecules may be regarded as a suitable system for the study of glassy dynamics by means of electrical measurements at RT.

