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Updated: May 31, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Published on: May 10, 2021
A quantitative study of valence electron transfer in the skutterudite compound CoP(3) by combining x-ray induced
S Diplas1, O Prytz, O B Karlsen
1Centre for Materials Science and Nanotechnology, University of Oslo, PO Box 1126, Blindern, NO-0318 Oslo, Norway. Department of Physics, University of Oslo, PO Box 1048, Blindern, NO-0316 Oslo, Norway.
Abstract:
We use the sum of the ionization and Auger energy, the so-called Auger parameter, measured from the x-ray photoelectron spectrum, to study the valence electron distribution in the skutterudite CoP(3). The electron transfer between Co and P was estimated using models relating changes in Auger parameter values to charge transfer. It was found that each P atom gains 0.24 e(-), and considering the unit formula CoP(3) this is equivalent to a donation of 0.72 e(-) per Co atom. This is in agreement with a recent electron energy-loss spectroscopy study, which indicates a charge transfer of 0.77 e(-)/atom from Co to P.
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