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Updated: May 31, 2026

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
13:58

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics

Published on: September 28, 2016

First-principles study of the electronic structures and dielectric properties of the Si/SiO(2) interface

Tomoya Ono1, Yoshiyuki Egami, Katsuhiro Kutsuki

  • 1Department of Precision Science and Technology, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan.

Journal of Physics. Condensed Matter : an Institute of Physics Journal
|June 23, 2011
PubMed

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