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Related Experiment Video

Updated: May 31, 2026

All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

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Published on: January 19, 2018

Phantom force induced by tunneling current: a characterization on Si(111).

A J Weymouth¹, T Wutscher, J Welker

¹Institute of Experimental and Applied Physics, University of Regensburg, Regensburg, Germany.

Physical Review Letters

|June 28, 2011

Summary

Tunneling current affects atomic force measurements on low-conductivity samples. This current lowers the effective gap voltage, causing an apparent repulsive force, impacting surface science studies.

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Area of Science:

Surface science
Atomic force microscopy
Scanning tunneling microscopy

Background:

Simultaneous atomic force and tunneling current measurements offer complementary insights into surface electronic and structural properties.
Understanding these properties is crucial for advancements in materials science and nanotechnology.

Purpose of the Study:

To investigate and characterize the impact of tunneling current on atomic force measurements.
To elucidate the mechanism behind the observed force variations in low-conductance samples.

Main Methods:

Utilizing simultaneous measurements of tunneling current and atomic forces.
Analyzing data from samples with limited electrical conductivity.

Main Results:

A significant impact of tunneling current on measured atomic forces was observed.
The tunneling current lowers the effective gap voltage due to sample resistance.
This reduction in voltage leads to decreased electrostatic attraction, manifesting as an apparently repulsive force.

Conclusions:

The observed effect is significant for low-conductance samples, including adsorbed molecules.
This phenomenon is expected to influence Kelvin probe measurements when tunneling is present.
Accurate interpretation of force data requires accounting for tunneling current effects in low-conductivity systems.