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Related Experiment Video

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Scanning-probe Single-electron Capacitance Spectroscopy

Scanning-probe Single-electron Capacitance Spectroscopy

Published on: July 30, 2013

Combining scanning probe microscopy and x-ray spectroscopy.

Carole Fauquet¹, Maël Dehlinger, Franck Jandard

¹Université de la Méditerranée, CNRS-CINaM, Faculté des Sciences de Luminy, case 913, 13288 Marseille cedex 09, France. fauquet@cinam.univ-mrs.fr.

Nanoscale Research Letters

|June 30, 2011

Summary

A novel instrument merges Shear Force Microscopy and X-Ray Spectroscopy for simultaneous surface topography and chemical mapping. This versatile tool analyzes material luminescence and X-ray fluorescence, offering precise nanoscale chemical insights.

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Area of Science:

Materials Science
Nanotechnology
Surface Science

Background:

Simultaneous surface topography and chemical analysis are crucial for materials characterization.
Existing techniques often lack the resolution or simultaneous multi-modal capabilities required for advanced nanoscale studies.

Purpose of the Study:

To design and construct a versatile tool combining Shear Force Microscopy (SFM) and X-Ray Spectroscopy (XRS).
To achieve simultaneous acquisition of surface topography and chemical information at the nanoscale.
To demonstrate the tool's capability in analyzing material luminescence and X-ray fluorescence.

Main Methods:

A novel instrument integrating SFM with XRS was developed.
A sharp optical fiber was used as the SFM probe for local luminescence collection.
An X-ray capillary was employed for local X-ray fluorescence detection.
Simultaneous near-field imaging of topography and luminescence under X-ray irradiation was performed.

Main Results:

The tool successfully obtained simultaneous surface topography and chemical mapping.
Tests on ZnO and ZnWO4 thin layers showed results consistent with conventional techniques.
Simultaneous acquisition of surface topography and X-ray-induced luminescence was demonstrated.
Preliminary X-ray fluorescence analysis of a Co-Ti sample was successfully conducted.

Conclusions:

The developed instrument is a versatile tool for simultaneous surface topography and chemical mapping.
The combined SFM and XRS approach provides valuable insights into material properties.
The technique shows promise for advanced nanoscale chemical analysis and materials characterization.