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Pressure and scattering regime influence on the EDS profile resolution at a composite interface in environmental SEM

Claire Arnoult1, Jean Di Martino, Lahcen Khouchaf

  • 1Department of Advanced Materials and Structures, Centre de Recherche Public Henri Tudor, L-4002 Esch-sur-Alzette, Luxembourg. claire.arnoult@tudor.lu

Micron (Oxford, England : 1993)
|July 5, 2011
PubMed

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