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Updated: May 31, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Template synthesis and forming electrical contacts to single Au nanowires by focused ion beam techniques
S Valizadeh1, M Abid, F Hernández-Ramírez
1Ångströmlaboratoriet, Universitet Uppsala, Lägerhyddsvägen 1, SE-751 21 Uppsala, Sweden.
Abstract:
Metallic Au nanowires were electrochemically synthesized in 20 µm thick ion track etched polycarbonate membranes with the nominal pore diameter of 200 nm. Scanning and transmission electron microscopy analysis and x-ray diffraction of samples revealed that the nanowires are dense with a fcc [Formula: see text] texturing. The I-V characteristics of a single Au nanowire were investigated using a four-point microprobe set-up. The Au nanowire was placed in electrical contact with electrodes patterned on planar substrates using a dual-beam focused ion beam technique. The resistivity of the Au nanowires was found to be 2.8 × 10(-4) Ω cm.

