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Updated: May 31, 2026

High-Speed Magnetic Tweezers for Nanomechanical Measurements on Force-Sensitive Elements
Published on: May 12, 2023
Shear-mode magnetic force microscopy with a quartz tuning fork in ambient conditions
Kyungho Kim1, Yongho Seo, Hyunjun Jang
1Center for Nearfield Atom-Photon Technology and School of Physics, Seoul National University, Seoul 151-747, Korea.
Abstract:
We have demonstrated high-resolution shear-mode magnetic force microscopy (MFM) using a quartz tuning fork in ambient conditions. A commercial magnetic cantilever tip was attached to one prong of the tuning fork to realize shear-mode MFM operation. We have obtained MFM images with a spatial resolution of less than 100 nm and demonstrated a frequency resolution of ∼1 mHz, values which are achieved by phase shift detection methods.
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