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Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Related Experiment Video

Updated: May 31, 2026

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
10:25

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

Nanoscale capacitance imaging with attofarad resolution using ac current sensing atomic force microscopy.

L Fumagalli1, G Ferrari, M Sampietro

  • 1Dipartimento di Elettronica e Informazione, Politecnico di Milano, Piazza Leonardo da Vinci 32, I-20133 Milano, Italy.

Nanotechnology
|July 6, 2011
PubMed
Summary
This summary is machine-generated.

This study demonstrates nanoscale capacitance imaging with attofarad resolution using atomic force microscopy. The technique accurately maps dielectric properties of thin films, offering new insights into nanoscale materials.

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Scanning-probe Single-electron Capacitance Spectroscopy
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Last Updated: May 31, 2026

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
10:25

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

Active Probe Atomic Force Microscopy with Quattro-Parallel Cantilever Arrays for High-Throughput Large-Scale Sample Inspection
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Scanning-probe Single-electron Capacitance Spectroscopy
10:53

Scanning-probe Single-electron Capacitance Spectroscopy

Published on: July 30, 2013

Area of Science:

  • Materials Science
  • Nanotechnology
  • Surface Science

Background:

  • Characterizing nanoscale dielectric properties is crucial for advanced materials.
  • Existing techniques often lack the required resolution and sensitivity.

Purpose of the Study:

  • To report nanoscale capacitance imaging with attofarad resolution.
  • To investigate the dielectric properties of nano-structured oxide thin films.

Main Methods:

  • Utilized ac current sensing atomic force microscopy (AFM).
  • Achieved attofarad (aF) resolution for capacitance measurements.
  • Correlated capacitance images with topographic profiles.

Main Results:

  • Capacitance images closely followed the topographic profile with nanometre vertical resolution.
  • Capacitance variations were attributed to tip-apex probing, not stray capacitance.
  • Capacitance-distance measurements validated the findings.

Conclusions:

  • The developed AFM technique provides high-resolution nanoscale capacitance imaging.
  • This method offers new insights into dielectric properties of thin films, membranes, and monolayers.
  • Enables characterization of materials with non-voltage-dependent capacitance.