Transmission electron microscope imaging of single-walled carbon nanotube interactions and mechanics on nitride grids

A method for analysing systems of isolated single-walled carbon nanotubes is of paramount importance if their structural characteristics are to be fully understood and utilized. Here we offer a simple technique for analysing such systems, with unprecedented contrast, using transmission electron microscope imaging of carbon nanotubes suspended over large holes in a silicon nitride grid. The nanotubes are grown directly on the viewing grids, using the chemical vapour deposition process, thus avoiding the use of chemicals or aggressive treatments. This method is simultaneously non-invasive, reusable, allows the analysis of multiple structures based on carbon nanotubes and is quickly implemented.