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In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
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Scaling behaviors of the voltage distribution in dielectric breakdown networks

J S Lee1, B Kahng

  • 1Department of Physics and Astronomy, Seoul National University, Seoul, Korea.

Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics
|July 7, 2011
PubMed

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