Enhanced field emission from injector-like ZnO nanostructures with minimized screening effect
1School of Electronic Science and Engineering, Southeast University, Nanjing 210096, People's Republic of China. School of Electrical and Electronic Engineering, Nanyang Technological University, Nanyang Avenue, 639798, Singapore.
Nanotechnology
|July 7, 2011
Summary
Optimized zinc oxide (ZnO) nanostructures exhibit enhanced field emission properties. Controlling nanostructure density is key to achieving superior performance for ZnO devices.
Area of Science:
- Materials Science
- Nanotechnology
- Condensed Matter Physics
Background:
- Zinc oxide (ZnO) nanostructures are promising for electronic applications.
- Field emission properties are crucial for devices like field emission displays and X-ray sources.
- Controlling nanostructure morphology and density influences their electronic behavior.
Purpose of the Study:
- To synthesize injector-like ZnO nanostructures on a silicon substrate.
- To investigate the effect of areal density on the field emission properties of ZnO nanostructures.
- To determine optimal conditions for low turn-on field and high current density.
Main Methods:
- Vapour phase transport method used for ZnO nanostructure synthesis.
- Temperature control employed to vary areal densities of nanostructures.
- Field emission measurements conducted to characterize performance.
Main Results:
- Field emission properties strongly depend on the areal density of ZnO nanostructures due to screening effects.
- The lowest field emission turn-on field of 1.85 V µm⁻¹ was achieved at a current density of 10 µA cm⁻².
- Optimal sample parameters: 850 nm needle length and 1 × 10⁸ cm⁻² areal density.
- A current density of 1 mA cm⁻² was reached at an applied field of 4.7 V µm⁻¹.
Conclusions:
- Areal density is a critical factor in optimizing field emission from ZnO nanostructures.
- The synthesized ZnO nanostructures demonstrate excellent field emission characteristics.
- These findings suggest potential for ZnO nanostructures in advanced electronic applications.

