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Updated: May 31, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
08:12

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on: December 5, 2015

Low-resistance ohmic contacts to SiC nanowires and their applications to field-effect transistors

Chan-Oh Jang1, Tae-Hong Kim, Seung-Yong Lee

  • 1Department of Semiconductor Science and Technology, SPRC, Chonbuk National University, Jeonju 561-756, Korea.

Nanotechnology
|July 7, 2011
PubMed

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