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In Depth Analyses of LEDs by a Combination of X-ray Computed Tomography (CT) and Light Microscopy (LM) Correlated with Scanning Electron Microscopy (SEM)
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Advances on surface structural determination by LEED

Edmar A Soares1, Caio M C de Castilho, Vagner E de Carvalho

  • 1Departamento de Física, ICEX, Universidade Federal de Minas Gerais, 31270-090, Belo Horizonte, MG, Brazil. edmar@fisica.ufmg.br

Journal of Physics. Condensed Matter : an Institute of Physics Journal
|July 13, 2011
PubMed

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