Updated: May 31, 2026

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
P Muñoz1, R García-Olcina, C Habib
1Institute for Telecommunications and Multimedia Applications, Universitat Politècnica de València, Valencia, Spain. pmunoz@iteam.upv.es
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