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In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices
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Extraordinary transmission through dielectric screens with 1D sub-wavelength metallic inclusions

V Delgado1, R Marqués, L Jelinek

  • 1Department of Electronics and Electromagnetism, University of Seville, Seville, Spain. vdelgado@us.es

Optics Express
|July 13, 2011
PubMed

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